2 edition of Extraction error modelling and automated debugging in high-performance custom designs. found in the catalog.
Extraction error modelling and automated debugging in high-performance custom designs.
Written in English
Test model generation is a crucial step in the design cycle of high performance VLSI circuits. A key step in test model generation is logic extraction, which generates a gate-level netlist from a transistor-level design. Logic extraction is error-prone due to human interference and limitations of the automated extraction tools. Currently, extraction errors require a resource intensive and time consuming manual debugging.This thesis, first, presents a case study of several typical extraction errors found in an industrial environment based on the core circuits used in the PentiumRTM 4 microprocessor. Secondly, it proposes an automated debugging methodology for these extraction errors that occur in strictly pipelined sequential circuits. This circuit structure resembles the architecture of high-speed industrial components found in modern microprocessors. The method is applicable to designs with full, partial and no memory equivalence information. Experimental results confirm the fitness and the advantage of this automated debugging approach.
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Welcome to the DesignCon agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission. high-performance CMOS circuit design, including layout automation, standard-cell methodologies, and circuit tuning. Rick Seigler IBM System Division, South Road, Poughkeepsie, New York ([email protected]). Mr. Seigler joined IBM Poughkeepsie in after receiving.
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This paper analyzes typical extraction errors applicable to clocking schemes seen in high-performance designs today. An automated debugging solution for these errors in designs with no state.
Automated debugging approaches are necessary to speed up the design process as size and complexity of VLSI designs increase. Among these approaches, debugging based on. Aitken, Debugging High Performance Embedded Memories, SDD Workshop, 2 self-timing path and the data timing path.
The self-timing path is designed to track process variations in the data path, independent of the nature of the clock signal (duty cycle, slew, etc.). See  for more information on memory architecture and Size: 26KB. From tohe has been a Research Associate of VLSI Design and Education Center, the University of Tokyo.
His research interests include formal verification of system-level designs, automated debugging and debugging support for pre- and post-silicon circuits, education and teaching materials on electric and electronic circuits.
Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and.
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Advanced debug features, profiling, support of multicore and multi-CPU. In particular, this book covers techniques for synthesis and optimization of digital circuits at the architectural and logic levels, i.e., the generation of performance-and/or area-optimal circuits representations from models in hardware description languages.
Searle A, Gough J and Abramson D Automating relative debugging Proceedings of the 18th IEEE International Conference on Automated Software Engineering, () Govindarajan R, Yang H, Amaral J, Zhang C and Gao G () Minimum Register Instruction Sequencing to Reduce Register Spills in Out-of-Order Issue Superscalar Architectures, IEEE.
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Litho-Etch-Litho-Etch (LELE) double pattern (DP) processing affects many aspects of the design flow at/below the 20 nm node level. This can be very disruptive for the custom designer, impacting basic cell design strategy, layout rules and debug as well as parasitic extraction.
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technique for automatic model extraction based on moni-toring data, ii) a simulation-based tool for automated per-formance prediction and capacity planning, iii) An experi-mental evaluation of the modeling and automation approach demonstrating its practical applicability.
The rest of this paper is organized as follows: In Section 2. N__UK_Cover_UK 10/30/13 AM Page 2. The following subject catalogs are available from CRC Press. View them online at the URL listed or contact your local sales representative for copies.
In this way, we achieve the highest performance with minimum memory size and highest memory utilization. Similarly, we can also extract the number, the composition and the connection scheme of execution units in the VLIW data path as shown in Fig. method starts with extracting the port number of multi-port memory for minimum execution time, then uses this information to customize the Cited by: 4.
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